Cable/Slipring/Interconnect Tester
QP-HSIT - High Speed Interconnect Tester
The Quantum Parametrics' High Speed Intercnnect Tester (HSIT) is designed to enble at speed testing of cables, slip-rings, backplanes and other interconnect technologies. The HSIT's eight generic DC, low speed and hgih speed channels are configured through technology specific Connector Saver Modules such as USB, FireWire, HDMI, DisplayPort, SATA, SAS, PCIe, Camera Link HS, etc... Quantum Parametrics plans to provide a variety of Connector Saver Modules. Custom modules may be developed upon request.
QP-ICT - IEEE-1394 Beta Interconnect Tester
The Quantum Parametrics’ Interconnect Tester (ICT) provides the ability to test one (1) to five (5) interconnects simultaneously. An interconnect could be a cable, cable with slip-ring, or a series of devices that include a 1394 PHY. Each ICT connection provides outputs with amplitude control. Each output is individually calibrated and controlled for maximum configurability. Each port transmits packets to the 1394 bus and receives data from the 1394 bus. Each packet is verified by the receiver of the packet. Currently there are S400 (QP-ICT-4) and S800 (QP-ICT-8) versions of the ICT. The S400 and S800 indicate the maximum data rate supported. The default configuration for the ICT is capacitive coupled for both the -4 and -8. QP-ICT requires Windows XP.
The ICT application communicates with the ICT instrument via VersaPHYTM (the Backchannel). The host computer must provide a 1394 open host controller interface (OHCI). PCI, PCMCIA, and integrated OHCI are acceptable. The ICT has one bilingual (port 1) and two beta only ports (port 0 and 2). The Backchannel uses VersaPHY technology for communication between the PC and the ICT.